Microchip on a circuit.

Comprehensive Minimally/non-invasive Multifaceted
Assessment of Nano-/microelectronic Devices (CoMMAND)

An Air Force Office of Scientific Research (AFOSR) Multidisciplinary University Research Initiative (MURI)

About the Project

Hands holding a microchip.

Semiconductor chips are the heart of electronic products. Cellphones, computers, tablets, televisions, even washing machines — they all have chips in them made up of complex, miniature circuits. Ensuring these omnipresent microelectronic circuits work properly and are secure is essential for modern life, and can help avoid the malfunction of everything from smartphones to fighter jets. 

A research team led by the University at Buffalo will develop new ways to precision test microelectronic circuits. Their goals include increasing understanding of the physical processes that could be used to evaluate chip performance and security, and creating new, ultra-sensitive testing strategies.

The project is funded by a $7.5 million grant from the Air Force Office of Scientific Research through the Department of Defense’s highly competitive Multidisciplinary University Research Initiative (MURI).

Funding Source: Air Force Office of Scientific Research (AFOSR) Multidisciplinary University Research Initiative (MURI)
Award Amount: $7.5 Million
Related UB Departments:

AFRL Logo.

Research Focus Areas

Our researchers will collaborate to investigate magnetic, electronic, phononic, excitonic and ion-matter interactions with state-of-the-art sensing modalities to increase our understanding of the physical processes that could be used to evaluate chip performance and security, and create new, ultra-sensitive testing strategies.

  • electromagnetic field.

    Stray magnetic fields in microelectronic circuits provide a window into their structure and function. Researchers will capitalize on their ongoing developments to advance magnetic imaging of these circuits, allowing for new insights. 

  • microelectronic circuit.

    Sensing stray electric fields with precise nano-positioning is a critical tool for testing microelectronic circuits. Researchers propose a number of methods that will utilize new concepts.

  • atomic particle.

    Detecting single phonons in microelectronic circuits could open a new frontier in quantum metrology. Research in this area will aid in the development of electrical sensors capable of phonon detection at the most fundamental, single-quantum level.

  • artwork representing quantum physics.

    Excitons are bound pairs of electrons and electron holes. Researchers will demonstrate that excitons’ optical properties can be controlled at nanometer-length scales.

  • atoms lite up in varying degrees of light.
    Ion beam

    There’s currently no credible way to image microelectronic circuits in 3D with sub-50 nm resolution. Researchers will use an ion beam to do this, a technique that is extremely sensitive but causes minimal damage to the circuit.

Related News

Meet the Researchers

The project's principal investigator is Paras Prasad, SUNY Distinguished Professor in UB's departments of chemistry, physics, medicine and electrical engineering, and executive director of the Institute for Lasers, Photonics and Biophotonics (ILPB). Co-principal investigators include Jonathan Bird at the University at Buffalo; Katayun Barmak at Columbia University; Alexander Sergienko at Boston University; Ronald L. Walsworth at the University of Maryland; and John Schaibley at the University of Arizona. 

UB Team Members

Partner University Researchers

Other Senior Investigators

International Collaborators

Last Modified January 22, 2023