Krishna Rajan

ScD

Krishna Rajan

ScD

Krishna Rajan

ScD

Research Topics

Materials informatics; Quantitative high resolution imaging; Atom probe tomography

Contact Information

120 Bonner Hall

Buffalo NY, 14260

Phone: (716) 645-1380

krajan3@buffalo.edu

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Publications

Books

  • Information-driven approaches to materials discovery and design: Eds. T. Lookman, F. Alexander and K. Rajan -Springer Series in Materials Science (2015).
  • Informatics for Materials Science and Engineering: data-driven discovery for accelerated experimentation and application editor Krishna Rajan; Elsevier, Oxford ISBN: 9780123943996 (2013)
  • Complex Inorganic Solids: Structural Stability and Magnetic Properties of Alloys: eds: P.E.A.Turchi, A. Gonis, K. Rajan and A. Meike; Springer-Verlag NY (2005).
  • Properties of Complex Inorganic Solids II, eds. , A. Mieke, A. Gonis, P. Turchi and K. Rajan, Plenum Press, NY (2000).
  • Dislocations and Interfaces in Semiconductors, eds. K. Rajan, J. Narayan and D. Ast, TMS Warrendale, PA (1988).
  • Intermediate Voltage Microscopy and its Applications to Materials Science, ed. K. Rajan, Philips Electron Optics Publishing Group, Mahwah, NJ (1987).

Edited Special Issue Journals

  • Low Temperature Silicon Epitaxy, Guest eds. M.L. Green, K. Rajan and R. Reif, Journal of Electronic Materials (October 1990).
  • Strain Relaxation in Epitaxial Films, Guest eds. K. Rajan, E. Fitzgerald, K. Jagannadham and W. Jesser, Journal of Electronic Materials (October 1991).
  • Synthesis and Processing of Electronic Materials, guest eds. R. Singh and K. Rajan, Journal of Electronic Materials (September 1994).
  • The Development of Microstructure in Deposited Thin Films, guest eds. J.E. Sanchez, D. Knorr and K. Rajan, Journal of Electronic Materials (October 1994).
  • Engineering Science of Chem-Mechanical Planarization, guest eds. K. Rajan and M. Fury, Journal of Electronic Materials (October 1996).
  • Materials Science Issues in Chemical Mechanical Planarization, guest eds. K. Rajan and R. Singh, Journal of Electronic Materials (October 1998).
  • Interdisciplinary Approach to Alloy Design: Journal of Metals (JOM) Guest editors: A-M. Meike and K. Rajan (2000)
  • Advances in Bulk Metallic Glasses: guest editors: K.A. Kelton, L.A.Greer and K.Rajan Journal of Non-crystalline Solids 317 (1-2) (March 2003).
  • Materials Informatics parts I and II: Guest editor: Krishna Rajan: Journal of Metals, Materials & Minerals (JOM) (March 2008 and January 2009).
  • Materials Informatics: Guest editors: K. Rajan and P. Mendez: Journal of Statistical Analysis and Data Mining 1 (5-6) April 2009 and (May 2009).
  • Using Digital Data in Materials Science and Engineering: Guest editors: K. Rajan, J. Warren, and D. Raabe, A. Agarwal, C. Ward – focus issue: Integrating Materials and Manufacturing Journal (2014)

Invited Book Chapters, Reviews and Invited Journal Articles

  • Representations of Texture in Orientation Space in Electron Backscatter Diffraction in Materials Science Eds. Schwartz, A.J.; Kumar, M.; Adams, B.L. pp. 31-38, Kluwer Academic NY (2000)
  • Rodrigues-Frank Representations of Crystallographic Texture in Electron Backscatter Diffraction in Materials Science Eds. Schwartz, A.J.; Kumar, M.; Adams, B.L pp. 39-50 Kluwer Academic NY (2000).
  • Computational Informatics: Guided Discovery for Combinatorial Experiments in Combinatorial Materials Synthesis eds. X-D. Xiang and I. Takeuchi, pp435-458 Marcell Dekker NY (2003)
  • Informatics Based Optimization of Crystallographic Descriptors for Framework Structures; Arun Rajagopalan and Krishna Rajan in Combinatorial and High-Throughput Discovery and Optimization of Catalysts and Materials Editors: Wilhelm Maier and Radislav A. Potyrailo (CRC press – 2005).
  • Informatics Methods for Combinatorial Materials Science: C. Suh, K. Rajan, B.M. Vogel, B. Narasimhan and S.K. Mallapragada in Combinatorial Materials Science eds. B. Narasimhan, S.K. Mallapragada and M.D. Porter, 109-120 ; J. Wiley (2007).
  • Combinatorial Materials Sciences: Experimental Strategies for Accelerated Knowledge Discovery; Annual Reviews of Materials Research vol. 347, (April 2008)
  • Combinatorial Materials Science and EBSD: A High Throughput Experimentation Tool pp.189-201 in Electron Backscatter Diffraction in Materials Science Schwartz, A.J.; Kumar, M.; Adams, B.L.; Field, D.P. (Eds.) 2nd ed. (2009).
  • Scientific Data Analysis: C. Kamath, N.Wade, G. Karypis, G. Pandey, V. Kumar, K. Rajan, N.F. Samatova, P. Breimyer, G. Kora, C. Pan and S. Yoginath in Scientific Data Management eds. A. Shoshani and D. Rotem, Taylor and Francis pp.263-301 (2009).
  • Data Mining and Inorganic Crystallography in Data Mining in Crystallography; Series: Structure and Bonding, Vol. 134 Hofmann, Detlef W.M.; Kuleshova, Liudmila N. (Eds.) pp.59-89; Springer-Verlag (2010).
  • Materials Informatics for Molten Salt Chemistry: C. Suh, S. Gadzuric, M.Gaune-Escard and K.Rajan in Molten Salts and Ionic Solids eds. M. Gaune-Escard and K.R. Seddon; pp. 355-366; J. Wiley (2010)
  • Ontology Engineering: Computational Informatics for Materials Discovery in Models, Databases, and Simulation Tools Needed for the Realization of Integrated Computational Materials Engineering pp. 73-81 eds. S. Arnold and T. Wong –ASM International- Materials Park,OH (2011).
  • Combinatorial Materials Libraries: Review of State of the Art: R. Potyrailo, K. Rajan, K. Stoewe, I. Takeuchi, B. Chisholm, and H. Lam; ACS Combinatorial Sciences 13 (6) 579-633 (2011) Cited as among top ten papers in ACS Combinatorial Sciences for 2011 and 2012.
  • Atomic-Scale Tomography: a 2020 Vision: T.F. Kelly, M. K. Miller, K. Rajan and S. Ringer: Microscopy and Microanalysis 9 652-664 (2013).
  • Revisiting Computational Thermodynamics through Machine Learning of High Dimensional Data: S. Srinivasan and K. Rajan – IEEE: Computing in Science and Engineering-special issue- Machine Learning 1-11 vol. PP; DOI: 10.1109/MCSE.2013.76 (Sept/Oct. 2013).
  • Nanoinformatics: materials design for health and environmental needs: in Nanotechnology Environmental Health and Safety: Risks, Regulation and Management (2nd edition) Edited by Matthew Hull and Diana Bowman pp. 173-200 Elsevier, Oxford (2014).
  • Informatics Derived Materials Databases for Multifunctional Properties: S. Broderick and K. Rajan –Science and Technology of Advanced Materials 16 013501 (2015)
  • Materials Informatics: Big Data and the Materials Gene; Annual Reviews of Materials Research 45:153–169 (2015)
  • Advanced volume reconstruction and data mining methods in atom probe tomography ; F. Vurpillot, W. Lefebvre, J. Cairney, C. Oberdorfer, B. Geiser, and K. Rajan MRS Bulletin (2015)
  • Discovering Electronic Signatures for Phase Stability of Intermetallics via Machine Learning: S.R. Broderick and K. Rajan in Information-driven Approaches to Materials Discovery and Design; Eds. T. Lookman, F. Alexander and K. Rajan; Springer Series in Materials Science (2015)
  • Microstructural Informatics for Accelerating the Discovery of Processing-Microstructure-Property Relationships O. Wodo, S. Broderick, K. Rajan.” MRS Bulletin. 41, 603-609 (2016)
  • Harnessing the Big Data Paradigm for ICME: Shifting from Materials Selection to Materials Enabled Design S.R. Broderick, G.R. Santhanam, K. Rajan. JOM. 68, 2109-2115 (2016)

Instructional Materials, Web Publications and Public Science Outreach

Agency Reports

Papers

  • “Further Observations on the Fracture Behavior of Hot Isostatically Pressed Superalloy Compacts” K.Rajan and W. Wallace, National Research Council of Canada Technical Report: NAE-LTR-ST-481 (1971)
  • “Phase Stability and Grain Growth in P/M Nickel Based Superalloys IN100 and MAR-M246": K. Rajan, W.Wallace and R.T.Holt, National Research Council of Canada Technical Report: NAE-LTR-ST-625 (1973).
  • “The Plastic Zone in Stage I Crack Growth During Fatigue Deformation of Copper Single Crystals” K.Rajan, B.Ramaswami and S.M.L. Sastry, Metallurgical Transactions 64, 1959 (1975).
  • “A Transmission Electron Microscopy Study of Intermetallic Formation in Al-Cu Thin Film Couples” K. Rajan and E.R. Wallach; Journal of Crystal Growth 49 297 (1980).
  • “A TEM Study of Low-Temperature Intermetallic Formation in Thin Film Al-Cu Couples” K. Rajan and E.R. Wallach in Proc. 8th Intl. Vacuum Congress, Supplement a la Revue Le Vide les Couches Mince No. 201, 157 (1980).
  • “Room Temperature Strengthening Mechanisms in a Co-Cr-Mo Alloy” K. Rajan and J.B.Vander Sande, Journal of Materials Science 17, 769 (1982).
  • “Phase Transformations in a Wrought Co-Cr-Mo Alloy” Metallurgical Transactions 134, 1161 (1982).
  • “Twin-Twin Interactions in a Co-Cr-Mo Alloy”, Journal of Materials Science Letters 1, 482 (1982).
  • “Microstructural Study of a High Strength Stress-Corrosion Resistant 7075 Aluminum Alloy” K.Rajan, W. Wallace and J. Beddoes, Journal of Materials Science 17 2817 (1982).
  • “Kinetics of Growth in A Ti-6A1-4V Alloy” R. Luhta and K.Rajan National Research Council of Canada Technical Report: NAE-LTR-ST-1433 (1982).
  • “A Thermodynamic Assessment of Heat Treatments for a Co-Cr-Mo Alloy” Journal of Materials Science 18 257 (1983)
  • “Stacking Fault Strengthening in Low Stacking Fault Energy Alloys” Scripta Metallurgica 17 101 (1983).
  • “Determination of Pore Sizes at the Skin Layer Aromatic Polyamidohydrazide Ultrafiltration Membranes”, K. Rajan K. Chang and T. Matsura)., Journal of Polymer Science, Polymer Letters Edition 21 417 (1983).
  • “A TEM Study of Microstructural Changes During Retrogression and Reaging in 7075 Aluminum”,N.C.Danh, W.Wallace and K.Rajan, Metallurgical Transactions 14A 1843 (1983).
  • “Mircostructural Changes During Isothermal Forging of a Co-Cr-Mo Alloy” K.Rajan, J-P. Immarigeon and W. Wallace, Metallurgical Transactions, 15A 1335 (1984).
  • “Back Stresses in Single Phase Low Stacking Fault Energy Alloys” K.Rajan and T. Terada, Scripta Metallurgica 18 379 (1984).
  • “Nucleation of Recrystallization in a Co-Cr-Mo Alloy” Metallurgical Transactions 15A 1335 (1984).
  • “Rapid Soldification Processing - New Trends in Metallic Implant Technology” in Proc. 10th Canadian Medical and Biological Engineering Conf. p.130 (1984).
  • “Weak Beam TEM Study of a Fatigue Crack Tip in a 2024 Aluminum Alloy” K. Rajan and R.L.Hewitt, in Advances in Fracture Research, eds. S.R. Valluri et al. p. 2025, Pergamon Press, Oxford (1985).
  • “Rod Bending for Luque Instrumentation”, G.W.D. Armstrong, R. Black, S. Tremblay and K.Rajan Spine 9 838 (1984).
  • “Kinetics of the Martensitic FCC - HCP Transformation in Co-Cr-Mo Alloy Powders” N.C. Danh, D. Morphy and K.Rajan Acta Metallurgica 32 1317 (1984).
  • “Discussion of Effect of Retrogression and Reaging Treatments on the Microstructure of Al-7075-T651" D. Nguyen, W. Wallace and K.Rajan Metallurgical Transactions 16A 2068 (1985).
  • “Linear Elastic Properties of Trabecular Bone: A Cellular Solid Approach” Journal of Materials Science Letters 4 609 (1985).
  • “Weak Beam Imaging of Coherent Twin Boundaries After High Temperature Deformation” in Proc. 43rd Electron Microscopy Society of America, p.242, San Francisco Press, San Francisco (1985).
  • “The Role of Coherent Interphase Boundaries on Deformation” in Phase Boundary Effects on Deformation, eds. K.N. Subramanian and MA Imam, p.317, TMS, Warrendale, PA (1986).
  • “Intermediate Voltage Microscopy”,K.Rajan and P.B.Sewell Journal of Metals 38, 30 (1986).
  • “Surface Analysis in the Transmission Electron Microscope” K.Rajan and P.B.Sewell Journal of Metals 38 34 (1986).
  • “Extended Energy Loss Fine Structure Analysis at Intermediate Voltages” A. Delage, J.
  • McCaffrey, P.B. Sewell and K.Rajan in Intermediate Voltage Microscopy and its Applications to Materials Science, ed. K. Rajan, Philips Electron Optics Publ. Group, Mahwah, NJ, p.87 (1987).
  • “General Applicability of EELS k-Factors” T. Malis, J. Titchmarsh , G.C. Weatherly and K.Rajan in Intermediate Voltage Microscopy and its Applications to Materials Science ed. K. Rajan, Philips Electron Optics Publ. Group, Mahwah, NJ, p.78 (1987).
  • “An Experimental Study of X-ray Production at 300 kV”, K.Rajan P.B. Sewell, C.R. Leavens, J. McCaffrey and G. L’Esperance) in Intermediate Voltage Microscopy and its Applications to Materials Science, ed. K. Rajan, Philips Electron Optics Publ. Group, Mahwah, NJ, p.ll (1987).
  • “Misfit Dislocation Structure at a Si/SixGe1-x Strained Layer Interface”, K.Rajan and M.Denhoff , Journal of Applied Physics 62 1710 (1987).
  • “Electrical Measurements on MBE Grown Si/SixGe1-x Heterojunctions” M. Denhoff, J-M Baribeau, D.C. Houghton and K.Rajan Journal of Crystal Growth, 81, 445 (1987).
  • “Dislocation Structure in GaAs/InxGa1-xAs Strained Layer Superlattices” K.Rajan, R. Devine, P. Maigne and T.W. Moore, Journal of Applied Physics, 62, 1713 (1987).
  • “Ordering in Si/SixGe1-x Crystals” D. Lockwood, K.Rajan, E.W. Fenton, J-M. Baribeau , M. Denhoff, Solid State Communications, 61, 465 (1987).
  • “Ion-assisted Sputter Deposition of CdTe Layers” S.R. Das, P. van der Meer, J.G. Cook and K.Rajan Canadian Journal of Physics, 65, 864 (1987).
  • “Defects in Strained Layer Semiconductors”, Journal of Metals, 39. 24 (1987).
  • “Characterization of Heteroepitaxial InSb Films on GaAs Prepared by Metallorganic Magnetron Sputtering”, T.S. Rao, C. Halpin, J.B. Webb, J.P. Noad and K.Rajan Thin Solid Films, 163, 399 (1988).
  • “Defect in Lattice Mismatched Systems”, in Dislocations and Interfaces in Semiconductors, p.51, eds. K. Rajan, J. Narayan and D. Ast, TMS Warrendale, Pa (1988).
  • “Defect Characterization of MBE Grown ZnSe/GAs and ZnSe/Ge Heterostructures by Cross- sectional Planar TEM” S.B. Sant, J. Kleiman, M. Melech, R.M. Park, G.C. Weatherly, R.W. Smith and K.Rajan. in Proc. 5th Oxford Conf. on Microscopy of Semiconducting Materials Inst. Phys. Conf. Ser. #87 (2) p.129 (1987).
  • “Defect Structure in Epitaxial CdTe Thin Films” in Dislocations and Interfaces in Semiconductors, p. 187, eds. K. Rajan, J. Narayan and D. Ast, TMS, Warrendale, PA (1988).
  • “Process Related Defects in ZnSe Grown by MBE”) J. Kleiman, R.M. Park, H. Mar and K.Rajan in Dislocations and Interfaces in Semiconductors, p.129, K. Rajan, J. Narayan and D. Ast, TMS, Warrendale, PA (1988).
  • “The Role of Precious and Rare Metals in Semiconductor Alloys: Non-equilibrium Effects” in Precious and Rare Metal Technologies, p.589, eds. A. Torma and I.H. Gundlier, Elsevier Science Publ., Amsterdam (1988).
  • “Deformation Processing of High Tc Superconducting Wire” ) R.N. Wright, R.H. Doremus, R.M. German, D.B. Knorr, R.A. MacCrone and K.Rajan in Processing Appications of High Tc Superconductors: Status and Prospects, p.139, ed. W. Mayo, TMS Warrendale, PA (1988).
  • “Crystal Defects, Grain Boundaries and Texture in Yba2Cu3O7-x Subjected to Deformation Processing” R.N Wright, R.H. Doremus, R.M. German, D.B. Knorr, R.A. MacCrone and K.Rajan in Processing Applications of High Tc Superconductors: Status and Prospects, p.139, ed. W. Mayo, TMS, Warrendale, PA (1988).
  • “Defect Structure Analysis of Thin Epitaxial Films with Very Large Lattice Mismatch”, K-H.Park, H.Mar, J.Kleiman and K.Rajan MRS Proc (1988).
  • “Deformation Processing of High Tc Superconducting Oxides”,) R.M. German, D.B. Knorr, R.A. MacCrone, W. Misiolek , R.N. Wright an d K.Rajan Journal of Metals, 41 28 (1989).
  • “Radiation Effects on Compound Formation in Palladium Implanted Silicon Using a Focused Ion Beam Machine”, S. Balakrishnan, J.C. Corelli and K.Rajan Journal of Nuclear Materials, 16979 (1989)
  •  “Electromigration in Al/SiO2 Films Prepared by Partially Ionized Beam Deposition Technique”, P. Li, A.S. Yaspir, T-M. Lu, S. Roberts and K.Rajan, Applied Physics Letters, 54 2443 (1989).
  • “Interface Characterization of Epitaxial Ag Films on Si(100) and Si(111) Grown by Molecular Beam Epitaxy”, K-H. Park, G-C. Wang, G.A. Smith and K.Rajan Metallurgical Transactions A 21 2323 (1990).
  • “Twin Boundaries in C54-TiSi2" Metallurgical Transactions A 21 2317 (1990).
  • “Elastic Accommodation of Heteroepitaxial InSb Films on GaAs”, R. Gong, K. Rajan and J. Webb, Applied Physics Letters, 57 287 (1991).
  • “Electron Diffraction Study of Defects at an Heteroepitaxial Interface”, Applied Physics Letters, 58 287 (1991).
  •  “Control of Misoriented Grains and Pinholes in CoSi2 Grown on Si (001)”, J.R. Jiminez, L.M. Hsuing, L.T. Schowalter, S. Hashimoto, R.D. Thompson, and S.S. Lyer and K.Rajan Applied Physics Letters, 57 2811 (1990).
  • “Dislocation Configurations in Si/SixGe1-x Strained Layer Heterostructurs”, Journal of Electronic Materials, 19 1009 (1990).
  • “Dislocations Constrictions at a Si/SixGe1-x Interface”, Applied Physics Letters, 57 1135 (1990).
  • “Growth of CoSi2 on Si (001): Structure, Defects and Resistivity”, J.R. Jiminez, L.J. Schowalter, L.M. Hsuing, S. Hashimoto, R.D. Thompson , S.S. Lyer and K.Rajan J. Vac. Sci. Tech., A8(3) 3014 (May/June 1990).
  • “Oxidation of TiSi2", T. Sandwick and K. Rajan; Journal of Electronic Materials, 19 1193 (1990).
  • “Strain Interactions between Dislocation Arrays in Epitaxial SixGe1-x Heterostructures” B. Bartholomeusz and K.Rajan Journal of Electronic Materials, 19 943 (1990).
  • “Organic Liquids as an Experimental Model System for Grain Growth” M. Selleck, M.Glicksman and K.Rajan in Simulation and Theory of Evolving Microstructures and Textures, eds. M.P. Armstrong and A. Rollet, p.79, TMS, Warrendale, PA (1990).
  • “Superconducting Properties and Defects in Yba2Cu3O7-x” J. Darab, R. Garcia, R.K. MacCrone and K.Rajan in Superconductivity and Applications, eds. H.S. Kwok, p.441, Plenum Press, NY (1990).
  • “Effects of Doping on Phase Stability and Defect Structure in Y Based Cuprates: in-situ TEM Studies” R. Garcia, R. Vijayarhagavan, L.C. Gupta and K.Rajan in Superconductivity and Applications, eds. H.S. Kwok, p. 611, Plenum Press, NY (1990).
  • “Growth and Characterization of Epitaxial CoSi2 on Si(100)” J.R. Jiminez, L.M. Hsuing, R.D. Thompson, K.V. Ramanath, S.S. Iyer , L.J. Schowalter and K. Rajan in MRS proc. vol. 126, pp.237-242 (1990).
  • “Effect of High Temperature Deformation on Grain Boundary Defects in Yba2Cu3O7-x” R. Garcia, W. Misiolek R.N. Wright and K. Rajan in MRS proc. vol. 169, pp. 827-830 (1990).
  • “Microstructural Characterization of Texture in Tungsten Films Made by Ion-assisted Evaporation” R. Roy, R. Petkie , K.V. Ramanathan and K. Rajan in MRS proc., pp. 43-47 (1990).
  • “Geometrical Modeling and Defect Chemistry of Orthogonal Domain Interfaces in Yba2Cu3O7-x” J. Darab, R.K. MacCrone and K.Rajan Physica C, 173 213 (1991).
  • “On the Nature of Multiple Orientation Relationships in Epitaxial Silicides” L.E. Felton, S. Dakshinamurthy and K.Rajan in MRS proc, vol. 202, p.7 (1991).
  • “Microstructural Development in Ion Beam Assisted Evaporation in Ni, Co and Fe Films” J. Trogolo, R. Roy, R. Petkie and J.J. Cuomo and K. Rajan MRS proc., vol. 202, p.187 (1991).
  • “Stress Orientation Dependence of Dislocation Glide in Epitaxial Films” S. Dakshinamurthy and K. Rajan in MRS proc., vol. 202, p.597 (1991).
  • “Characterization of Interfacial Structure in Large Lattice Mismatch Heteroepitaxy of Ag/Si(111)” D.C. McKenna, G-C. Wang and K. Rajan in MRS proc., vol 209, p.643 (1991).
  • “New Concepts in Modeling Interfacial Defects in YBa2CuO7-x” J.G. Darab, R.K. MacCrone and K.Rajan in MRS proc., vol. 209 (1991).
  • “Geometrical and Stereochemical Modeling of Interfacial Defects in Yba2Cu3O7-x” J.G. Darab and R.K. MacCrone and K. Rajan in High Temperature Superconducting Compounds III, p.239, eds. S.H. Whang, D. Dasgupta and R. Laibowitz, TMS, Warrendale, PA (1991).
  • “Intermediate Voltage (S)TEM Microanalysis” Scanning-Journal of Scanning Microscopy, 13 (suppl. I) 17 (1991).
  • “Hydride Formation in an Al-Cu-Li Alloy” R. Balasubramanian, D.J. Duquette and K.Rajan Acta Metall. et Mater., 39 2607 (1991).
  • “On Stress Corrosion Cracking in Aluminum-Lithium Alloys” R. Balasubramanian, D.J. Duquette and K.Rajan Acta Metall. et Mater., 39 2597 (1991).
  • “The Application of the CSL/DSC Lattice Model to a Heteroepitaxial System -Ag/Si(111)” D. McKenna, G-C. Wang and K.Rajan Journal of Electronic Materials, 20 753 (1991).
  • “An Affine Deformation Description of Epitaxial Heterostructures” S. Dakshinamurthy and K.Rajan Journal of Electronic Materials, 20 747 (1991).
  • “Modeling Structural and Chemical Relaxation at the Al/Si Epitaxial Interface” B. Bartholomeuz, T-M. Lu and K.Rajan Journal of Electronic Materials, 20 759 (1991).
  • “Study of Palladium Silicide Formed Using a Focussed Ion Beam Machine”, S. Balakrishnan, J.C Corelli and K.Rajan; J. Vac. Sci. and Tech., 89 2687 (Sept/Oct 1991).
  • “Microstructural Stability of Epitaxial CoSi2/Si(001) Interfaces”, L.M. Hsuing, J. Jiminez, L.J. Schowalter, K.V. Ramanath, R.D. Thompson, S.S. Iyer and K.Rajan Journal of Applied Physics, 70 4853 (1991).
  • “Dislocation Glide at a (100) SixGe1-x Interface” Applied Physics Letters, 59 2564 (1991).
  • “Control of Misoriented Grains and Pinholes in CoSi2 Grown on Si(100)” L.J. Schowalter, J.R. Jiminez, L.M. Hsuing, S.D. Hashimoto, R.D. Thompson, S.S. Iyer and K.Rajan Journal of Crystal Growth 111 948 (1991).
  • “Misfit Accommodation at Epitaxial Interfaces”, E. Fitzgerald, K. Jagannadham, W. Jesser and K.Rajan Journal of Electronic Materials, 20 861 (1991).
  • “Precipitates in Cu/Pb-Sn Solder Joints”, L. Felton, P.J. Ficalora, P.J. Singh and K.Rajan; Scripta Metall. et Mater., 25 2329 (1991).
  • “Cu-Sn Intermetallics in Laser Reflowed Solder Joints” L. Felton, P.J. Singh, P.J. Ficalora and K.Rajan in Materials Developments in Microelectronic Packaging: Performance and Reliability, eds. P.J. Singh, ASM Intl., Metals Park, OH, p.15 (1991).
  • “The Morphology of Cu-Sn Intermetallics in Cu/Pb-Sn Solder Joints” L. Felton, P.J. Singh, P.J. Ficalora and K.Rajan in Materials Developments in Microelectronic Packaging: Performance and Reliability, ed. P.J. Singh, ASM Intl., Metals Park, OH, p.23 (1991).
  • “Structure-Property Anisotropy in Strained Layer Heterostructures” D. Morris, Q. Sun, C. Lacelle, A. Roth, M. Simard-Normandin and K.Rajan Journal of Applied Physics, 71 2321-2327 (1992).
  • “Estimation of the Core Cut-off Parameter for Misfit Dislocations at a SixGe1-x/Si Interface”, Journal of Applied Physics, 71 5853 (1992).
  • “The Influence of Long Range Order on Fatigue Crack Initiation in a FeCo-V Intermetallic Compound”, N.S. Stoloff, T.R. Smith, C.G. Kallingal and K.Rajan Scripta Metall. et Mater., 27 1389-1393 (1992).
  • “Morphological Stability of Dislocation Loops in Cyclically Deformed Ni3Al”, C.G. Kallingal, T.R. Smith, N.S. Stoloff and K.Rajan Scripta Metall. et Mater., 27 1407-1412 (1992).
  • “Strain Controlled Fatigue of NiAl Crystals at Room Temperature”, C.G. Kallingal, T.R. Smith, N.S. Stoloff and K.Rajan Scripta Metall. et Mater., 27 1389-1398 (1992).
  • “Fabrication, Structure and Properties of MoSi2 Based Composites” D.E. Alman, K.G. Shaw, N.S. Stoloff and K.Rajan Mater. Sci. and Eng., A155 85-89 (1992).
  • “Twin Boundaries: Structure, Migration and Grain Growth”, Materials Science Forum, 94-96481-486 (1992).
  • “Microstructural Evolution and Texture Development in Thin Films”, J. Trogolo, R. Roy, J.J. Cuomo and K. Rajan Materials Science Forum, 94-96 537-542 (1992).
  • “Experimental and Theoretical Study of 2-D Grain Growth in Succinonitrile”, M.E. Glicksman, J. Norberg, M. Palmer, S.P. Marsh, C.S. Pande and K.Rajan Materials Science Forum, 94-96909-914 (1992).
  • “Abnormal Grain Growth in Copper Films During Magnetically Enhanced Plasma Processing”, M. Naeem, H. Leary and K.Rajan Journal of Electronic Materials, 21 1087-1091 (1992).
  • “Detection of Surface Response to Chemical/Mechanical Planarization of Silica Films” J. Trogolo and K.Rajan in MRS Proc., vol. 260, pp. 869-873 (1992).
  • “Structural Modification in Silica Films due to Chemical/Mechanical Polishing” J. Trogolo and K.Rajan in Proc. The Electrochemical Soc., p.382 (1992).
  • “Topological Stability of 2-d Vanishing Grains” V.E. Fradkov, M.E. Glicksman, J. Norberg, M. Palmer and K.Rajan in MRS Proc., vol. 398, p.391-398 (1992).
  • “Interface Structure of CoSi2 and MoSi2 Epitaxies on Silicon” in Emerging Optoelectronic Technologies, eds. A. Selvarajan, B.S. Sonde, K. Shenai and V.K. Tripathi, Vedam Books Intl., New Delhi (1992) (with S. Dakshinamurthy).
  • “Defects in III-V Materials and the Accommodation of Strain in Layered Semiconductors”, B. Steiner, J. Comas, W. Tseng, U. Laor , R.C. Dobbyn and K.Rajan Journal of Electronic Materials, 22 725-738 (1993).
  • “Defect Formation in Semiconductor Layers During Epitaxial Growth”, B. Steiner, J. Comas, W. Tseng, U. Laor, R.C. Dobbyn and K.Rajan Journal of Crystal Growth, 128, 543-549 (1993).
  • “Topological Rearrangements During 2D Normal Grain Growth”, V. Fradkov, M.E. Glicksman, M. Palmer and J. Norberg Physica D, 60, 50-60 (1993).
  • “An in-situ TEM Study of Electron Beam Induced Amorphous to Crystalline Transformation of Al2O3 Films on Silicon”, J. Liu, C.J. Barbero, J.W. Corbett, H. Leary and K.Rajan Journal of Applied Physics, 73 5272 (1993).
  • “Electron Irradiation Induced Crystallization of Amorphous Al2O3 Films on Silicon Substrates”, J.Liu, C.J. Barbero, J.W. Corbett, H. Leary and K.Rajan MRS Proc., vol. 311, p.239 (1993).
  • “Topological Events in 2-D Polycrystals” V.E. Fradkov, M.E. Glicksman and K.Rajan in Modeling of Coarsening and Grain Growth, pp. 183-194, eds. S.P. Marsh and C.S. Pane, TMS, Warrendale, PA (1993).
  • “Grain Growth in Succinonitrile” V.E. Fradkov, M.E. Glicksman, M. Palmer, J. Norberg and K.Rajan in Modeling of Coarsening and Grain Growth, pp. 217-226, eds. S.P. Marsh and C.DS. Pande, TMS, Warrendale, PA (1993).
  • “Consistency of 2-dimensional Grain Growth Rate Constants Verified by in-situ Observation of Succinonitrile” M.A. Palmer, V.E. Fradkov, M.E. Glicksman and K.Rajan in Modeling of Coarsening and Grain Growth, pp. 227-234, eds. S.P. Marsh and C.S. Pande, TMS, Warrendale, PA (1993).
  • “Optimal Control of Microstructural Gradients During Composite Fabrication”, R. Bhatka, K. Kyriakopolous, V. Fradkov H. Stephanou and K.Rajanin Advanced Composites Fabrication, eds. T. Chandra and A. Dhingra, pp. 1235-1241, TMS, Warrendale, PA (1993).
  • “Beam Processing and Microstructural Evolution in Thin Films” in Beam Processing of Advanced Materials, eds. J. Singh and S. Copley, pp 483-488, TMS, Warrendale, PA (1993).
  • “Loss of Solderability and Dewetting” in Materials and Mechanics Issues of Solder Applications, pp. 141-153, eds. F. Yost, M. Hosking and D.R. Frear, van Nostrand and Reinhold, NY (1993).
  • “Applications of Precious Metals of Silicide Formation: Morphological Stability Issues” R. Bhatkal and K.Rajan in Intl. Precious Metals Institute Conf., pp. 481-490, ed. P.K. Mishra, IPMI, Newport, RI (1993).
  • “Processing Effects on the Morphological Stability at Epitaxial Interfaces” R. Bhatkal and K.Rajan Journal of Electronic Materials, 23 907-912 (1994).
  • “Crystallographic Evolution of Microstructure in Thin Film Processing I - Grain Size”, J. Trogolo, R. Roy and K.Rajan Journal of Electronic Materials, 23 889-892 (1994).
  • “Crystallographic Evolution of Microstructure in Thin Film Processing II - Grain Boundary Structure”, R. Petkie, K-N. Tu and K.Rajan Journal of Electronic Materials, 23 893-900 (1994).
  • “Materials Processing Issues in Thin Films” R. Singh and K.Rajan Journal of Electronic Materials, 23 913-918 (1994).
  • ”Experimental Assessment of the Mullins von Neumann Grain Growth Law”, M. Palmer, V.E. Fradkov, M.E. Glicksman and K.Rajan Scripta Metall. et Mater. 30 633-637 (1994).
  • Topological Events in 2 dimensional grain growth: experiments and simulation: V.Fradkov, M.E.Glicksman and K.Rajan Acta Metall. et Mater., 42 2719-2727 (1994).
  • “Dislocation Structure in NiAl Single Crystals Cyclically Deformed at Ambient Temperatures”, C.G. Kallingal, T.R. Smith, N.S. Stoloff and K.Rajan Acta Metall. et Mater., 42 3731-3740 (1994).
  • “Analytical Description of Deformation Texture Gradients in Ceramic Superconductors” W. Gao,D. Bhattacharyya and K.Rajan in Processing of Long Lengths of Superconductors, eds. U. Balachandran, E.W. Collings and A. Goyal, pp. 311-320, TMS, Warrendale, PA (1994).
  • “Studying Orientation Relationships in Heteroepitaxial Systems”, S. Dakshinamurthy and K.Rajan Journal of Metals, 52 (1994).
  • “Near Surface Modification of Silica Induced by Chemical/Mechanical Polishing” J. Trogolo and K.Rajan Journal of Materials Science, 29 4554-4558 (1994).
  • “Fatigue Damage Accumulation in Ni3Al and NiAl” C.G. Kallingal, T.R. Smith, C. Nemec, N.S. Stoloff and K.Rajan Materials Science and Eng. A 502-510 192/193 (1995).
  • “Plasma Effects on Thin Film Microstructures” M. Naeem, S.M.R. Rossnagel and K.Rajan MRS Proc., vol. 343, pp. 113-119 (1994).
  • “Grain Growth in Copper Films Exposed to Magnetically Enhanced Plasmas”, N. Naeem, S.M. Rossnagel and K.Rajan J. Vac. Sci. & Tech. B, 13(2) 209-213 (1995).
  • “2-D Grain Growth in Rapidly Solidified Succinonitrile Films”, M. Palmer, M. Glicksman, V. Fradkov , J. Norberg and K.Rajan Metall. Trans. A 26 1061-1066 (1995).
  • “Dislocation Structures in Cyclically Deformed NiAl-Fe”, C.G. Kallingal, K. Matsugi, T.R. Smith, N.S. Stoloff and K.Rajan MRS Proc. (1996).
  • “Effect of Plasma Processing on the Morphological Evolution of Thin Films”, M. Naeem, C.G. Kallingal and K. Rajan Chemical Engineering Communications: Festschrift Issue for Prof. W.N. Gill, 152-153 221-229 (1996).
  • “An Analysis of Splitting Failures During the Drawing of Tungsten Wire”, P.E. Browning, C.L. Briant, B.A. Knudsen and K.Rajan Journal of Engineering Failure Analysis 2 105-115 (1995).
  • “Microstructural Stability Issues in the Reliability of Thin Film Interconnects”, in Reliability of Metals in Electronics 95-3, ed. H. Rathore, The Electochemical Society, pp. 81-93 (1995).
  • “Pattern Formation in Dislocation Sub-Structures”, C.G. Kallingal, N.S. Stoloff and KRajan in Micromechanics of Advanced Materials: J.C.M. Li Symposium, eds. S.N.G. Chu et al., pp. 5l-59, TMS, Warrendale, PA (1995).
  • “Near Core Effects of Misfit Dislocations at Epitaxial Interfaces”, in Micromechanics of Advanced Materials: J.S.M. Li Symposium, eds. S.N.G. Chu et al., pp. 5335-539, TMS, Warrendale, PA (1995).
  • “i n-situ Strain Analysis with High Spatial Resolution: A New Failure Inspection Tool for Integrated Circuit Applications”, T. Nshanian, R. Dove and K.Rajan Journal of Engineering Failure Analysis, 3 109-113 (1996).
  •  “Rodrigues-Frank Space Representation of Fiber Texture”,K.Rajan and R. Petkie in Polycrystalline Thin Films, p.207-212 eds. H. Frost, M.A. Parker, C.A. Ross and E. Holm, MRS vol. 403, Pittsburgh (1996).
  • “Crystallization Induced Sub-Grain Boundaries in Silicon Nitride” K.Rajan and P.Sajgalk in Engineer in g Ceramics ‘ 96: Higher Reliability Through Processin g , ed. G.N. Babini, M. Haviar and P. Sajgalik, p.213, NATO ASI Series, vol.25, Kluwer Academic Publishers, Dordrecht (1997).
  • “Phase Selection in Plasma Sprayed Alumina” R. Bhatkal and K.Rajan in Beam Processing of Materials, eds. J. Singh, S. Copley and J. Mazumder, pp. 181-186, ASM, Metals Park (1997).
  • “Microstructurally Induced Internal Stresses in Si3N4 Whisker Reinforced Si3N4 Ceramics”, K.Rajan and P. Sajgalik J. European Ceramic Society 17 1093 (1997).
  • “Chemical-Mechanical Polishing of Oxide Thin Films: The Rebinder-Westwood Phenomenon Revisited”, Journal of Electronic Materials 25 1581-1584 (1996).
  • “Analysis of Anisotropic Characteristics of Dislocation Loop Morphology”, D. Schwendeman and K.Rajan in Mathematics of Microstructural Evolution, pp. 161-171 ed. L-Q. Chen, B. Fultz, J.W. Cahn, J.R. Manning, J.E. Morral and J.A. Simmons, TMS-SIAM, Warrendale, PA, (1996).
  • “Surface Interaction Forces in Chemical-Mechanical Planarization. R. Singh, J. Adler, U. Mahajan, Y. Rabinovich, B.M. Moudgil and K.Rajan Thin Solid Films 308-309 529-532 (1997).
  • “Role of Microstructures on the Growth of Long Fatigue Cracks” A.K. Vasudevan , K. Sadananda and K.Rajan International Journal of Fatigue, 19 Issue 93 S151-S159 (1997).
  • “Low Energy Ion Beam Assisted Grain Size Evolution in Thin Film Deposition, J. Trogolo, R. Roy, J.J. Cuomo and K.Rajan J. Electronic Materials, 26 1270-1274 (1997).
  • “Oxidation Mechanism in Relation to High Temperature Crack Propagation Properties of Alloy 718 in H2/H2O/Inert Gas Environment” P. Browning, M.Henry and K.Rajan in Proceedings of Alloys 718, 625 and other Derivatives Conference - Pittsburgh, PA (1997).
  • “Rodriguez-Frank Mapping of Interface Crystallography”,in Boundaries & Interfaces in Materials: David A. Smith Memorial Symposium, pp.39-45 eds. R.C.Pond,W.A.T, Clark, A.H.King and D.B.Williams TMS, Warrendale PA (1997).
  • A Java Simulation Tool for Fuzzy Clustering. Concurrency: Practice and Experience:Egan, M.A., Krishnamoorthy, M. and Rajan, K. (1997) Special Issue on Java for Science and Engineering 9:1327-1332
  • FCLUST: A Visualization Tool for Fuzzy Clustering.Egan, M.A., Krishnamoorthy, M. and Rajan, K. (1998) SIGCSE 30:227-231.
  • “Crystallographic Evolution in Directionally Solidified Microstructures” J. Trogolo and K.Rajan in Microstructure Evolution: Characterization and Modeling, pp.39-47 eds. J. Dantzig and S. Marsh, TMS ,Warrendale (1998).
  • “Grain-size Area Distributions in Evolving Thin Films” M. Palmer, M.E. Glicksman and K.Rajan in Microstructure Evolution: Characterization and Modeling pp. 51-62 eds. J. Dantzig and S. Marsh, TMS, Warrendale (1998).
  • “Kinetic Studies of Dimensional Aspects in Thin Film Growth”, M. Palmer, M.E Glicksman and K.Rajan Acta Materialia 46 6397-6402 (1998).
  • “Mechanical Processes in Chemical-Mechanical Planarization: Plasticity Effects in Oxide Thin Films”, Journal of Electronic Materials 27 1077-1111(1998).
  • Synthesis and Microstructure of Conformal Coatings on Particulates P. Sajgalik, R. Singh, D. Kumar and K.Rajan in MRS Proceedings (1998).
  • “Microtexture and Anisotropy in Wire Drawn Copper”, R.Petkie and K.Rajan Materials Science and Engineering A 257 185-197 (1998).
  • Silicon Nitride Based Nano-, and Micro-Composites with Enhanced Mechanical Properties P. Šajgalík, K. Rajan, P. Warbichler, F. Hoffer, J. Dusza: Key Engineering Materials 159-160 405-410 (1999).
  • Sub-Grain Boundary Formation in Si3N4 Based Ceramics P. Šajgalík, K. Rajan, R. Riedel: Key Engineering Materials 161-163 229-243 (1999).
  • Grain Growth of Thin Films Conforming to Curved Surfaces M.Palmer, M.E.Glicksman and K.Rajan: Philosophical Magazine 79 763-774 (1999).
  • Local Chemistry Changes in Si3N4 Based Ceramics During Hot Pressing and Subsequent Subsequent Annealing K.Rajan and P.Sajglalik:: J.European Ceramic Society 19 2027-2032 (1999).
  • Phase Stability in Ga1-xInxAs1-ySby / GaSb Heterostructures Y-C.Chen, V.Bucklen, M.Freeman, R.P.Cardines Jr., G.Nichols, P.Sanders, G.Charache and K.Rajan: 4th NREL Conference , CP 460 535 (1999).
  • K.Rajan in Workshop Report on a Future Information Infrastructure for the Physical Sciences- The Facts of Matter: Finding, understanding and using information about our physical world - DOE Panel report : http://www.osti.gov/sciences/indes.html (2000).
  • Multidisciplinary Character of Alloy Science A-M. Mieke and K.Rajan: Journal of Metals 5213 (2000).
  • Data Mining: a Tool for Materials Discovery: M.Zaki and K.Rajan Proceedings of 17th CODATA meeting, Baveno Italy: electronic site: www.codata.org (2001).
  • Classification of Superconductors via Support Vector Machines K. Bennett, A. Michaels. M. Momma, C.Suh and K.Rajan: in Artificial Neural Networks in Engineering.
  • An Informatics Approach To Interface Characterization: Establishing a “Materials by Design” Paradigm: Krishna Rajan: in Science and Technology of Interfaces eds. S.Ankem and C.S.Pande TMS, Warrendale PA.
  • Quantitative Structure-Activity Relationships (QSARs) for Materials Science in Artificial Intelligence and Combinatorial Materials Science MRS, 700 S7.5.1-10 Pittsburgh PA, eds. I.Takeuchi et.al ; Krishna Rajan, Changwon Suh, Arun Rajagopalan and Xiang Li (2002).
  • Applications of Principal Component Analysis in Materials Science, Changwon Suh, Arun Rajagopalan, Xiang Li and Krishna Rajan; Data Science Journal 1 19-26 (2002).
  • Data Mining and Multivariate Analysis in Materials Science K.Rajan, A. Rajagopalan and C.Suh: in. Molten Salts – Fundamentals to Applications ed. M. Gaune-Escard Kluwer Academic p.241-248 (2002).
  • Application of Support Vector Machines to the Identification of Materials Attributes, A. O’Connor, K. Bennett, C. Suh, and K. Rajan, Proceedings of Intelligent Engineering Systems through Artificial Neural Networks, Vol 12. ASME Press, (2002).
  • Metallurgical Characterization of Friction Stir Welded 7050 T74 and C458 Aluminum Alloys: K.K.Sankaran, R.J.Lederich, K.Jata, K.Rajan and D.Schwartz : in Trends in Welding Research eds S.A. David, T. DebRoy, J.C. Lippold, H.B. Smartt, and J.M. Vitek; ASM, Metals Park, OH (2003).
  • Chemical Discovery in Molten Salts through Data Mining: C.Suh, A.Rajagopalan, X.Li and K.Rajan in International Symposium on Ionic Liquids; Festchrift in honor of Prof M.Gaune- Escard ; eds. H.A. Øye and A. Jagtøyen ; pp. 587-599 ; publ. Norwegian University of Science and Technology (2003).
  • Combinatorial Design of Semiconductor Chemistry for Bandgap Engineering: “virtual” combinatorial experimentation: C.Suh and K.Rajan ; Applied Surface Science 223 148-158 (2003).
  • “Secondary” Descriptor Development for Zeolite Framework Design: an informatics approach: A. Rajagopalan, C.Suh, X.Li and K.Rajan; Applied Catalysis A 254 147-160 (2003) – Special issue on Combinatorial Catalysis, Guest Editor: W. F. Maier.
  • Morphological Control of Tapered and Multi-Junctioned Carbon Tubular Structures: G. Bhimarasetti, M.K. Sunkara, U.M. Graham, B.H. Davies, C. Suh and K. Rajan; Advanced Materials 15 19 1629-1632 ( 2003).
  • Carbon Nanopipettes: R. Mani, X.Li, M.Sunkara and K.Rajan; Nanoletters 3 (5) 671-673 (2003).
  • Mechanisms for Nanocrystal Formation in Metallic Glasses K.F.Kelton, T.K.Croat, A.K.Gangopahdyay, A.L.Greer, L.-Q.Xiang, M. Weyland, X.Li and K.Rajan Journal of Non- crystalline solids 317 (1-2) 71-77 (2003).
  • An Informatics Approach to Materials Design: A.Rajagoplan, C.Suh , X.Li and K.Rajan in Proc. 7th Intl Conference on Systemics,Cybernetics and Informatics publ. Intl Institute of Informatics and Systemics (2003).
  • Annihilation Mechanisms in Thin Film Grain Growth: M.A. Palmer, M.E.Glicksman and K. Rajan; Scripta Materialia 48 1173-1178 (2003).
  • Computational Model for High Speed Screening of Polymer Microstructures: K. Wang, M.E. Glicksman and K. Rajan; Macromolecular Rapid Communications: Special Issue on Combinatorial and High Throughput Methods in Materials and Polymer Research 25, 377-381 (2004).
  • Combinatorial Materials Design Through Database Science: C. Suh, A. Rajagopalan, X. Li and K.Rajan in Symposium Combinatorial Materials Science and Artificial Intelligence: Materials Research Society (2004).
  • Modeling and Simulation for Phase Coarsening: a comparison with experiment: K. Wang, M.E.Glicksman and K. Rajan; Physical Review E 69 61507 (2004)
  • Size-Controlled Ni Nanocrystal Growth on Peptide Nanotubes and Their Magnetic Properties: L. Yu, I. A. Banerjee, M. Shima, K. Rajan, H. Matsui; Advanced Materials 16 709-712 (2004).
  • Data Management and Visualization of X-ray Diffraction Spectra from Thin Film Ternary Composition Spreads : I. Takeuchi, C. J. Long, O. O. Famodu, M. Murakami, J. Hattrick- Simpers, G. W. Rubloff, M. Stukowski and K. Rajan; Review of Scientific Instruments 7662223 (2005).
  • Property Predictions using Microstructural Modeling: K. G.Wang, Z. Guo, W. Sha, M.E. Glicksman and K.Rajan; Acta Materialia 53 3395-3402 (2005).
  • Length Scales in Phase Coarsening: Theory, Simulation and Experiment: K. G. Wang, M.E. Glicksman and K.Rajan; Journal of Computational Materials Science 34, 235-253 (2005).
  • Virtual Screening and QSAR Formulations for Crystal Chemistry: C. Suh and K. Rajan; Journal of QSAR and Combinatorial Sciences 24, 114 (2005).
  • Self Oriented Growth of GaN Films on Molten Gallium Hongwei Li, Hari Chandrasekaran, M K Sunkara, R. Collazo, Z. Sitar, K.Rajan in GaN, AlN, InN and their Alloys eds. C. Wetzel, B.Gil, M. Manfra and M. Kuzuhara Materials Research Society Proceedings vol .831 , (MRS , Pittsburgh – 2005).
  • Magnetic Behavior of Iron Oxide Nanoparticle-Biomolecule Assembly T. Kim, L. Reis, K. Rajan, and M. Shima, J. Magn. Magn. Mater. 295 (2) 132-138 (August 2005).
  • Materials Informatics: Krishna Rajan; Materials Today 35-39 (October 2005).
  • Biological Crystallization of Self-Aligned Iron Oxide Nanoparticles; Taegyun Kim, Krishna Rajan, and Mutsuhiro Shima, IEEE Transactions on Nanobioscience, 5, (3) 210-214 (Sept 2006).
  • Extracting Information From Molten Salt Database Slobodan Gadzuric, Changwon Suh, Marcelle Gaune-Escard, and Krishna Rajan; Met Trans 37A: 3411-3414 (2006).
  • Linking Length Scales via Materials Informatics Zi-Kui Liu, Long-Qing Chen and Krishna Rajan Journal of Metals 58 42-50 (2006).
  • Quantitative Analysis and Feature Recognition in 3D Microstructural Data Sets: A.C.Lewis, C. Suh, M. Stukowski, A.B. Geltmacher, G. Spanos and K. Rajan, Journal of Metals, TMS vol.58, 52-56 TMS (December 2006).
  • Informatics for Combinatorial Experiments: Accelerating Data Interpretation M. Stukowski, C. Suh, K. Rajan, P. D. Tall1, A. C. Beye, A. G. Ramirez, W. O. Soboyejo, M. L. Benson, P.K. Liaw; MRS Proceedings vol 894 (2006).
  • NSF NSDL Materials Digital Library & MSE Education Laura M. Bartolo, DianeGeraci, Sharon C. Glotzer, Cathy S. Lowe Adam C. Powell IV, Donald R. Sadoway ,Krishna Rajan, James A. Warren, Vinod K. Tewary MRS Proceedings vol 894 (2006).
  • Principal Component Analysis of Catalytic Functions in the Composition Space of Heterogeneous Catalysts ; S. C. Sieg, C. Suh, T. Schmidt , M. Stukowski, K. Rajan and W. F. Maier- J. Combinatorial Chemistry: 26 528-535 (2007).
  • Nanoindentation of Ni-Ti Thin Films- P. D. Tall , S. Ndiaye , A. C. Beye, Z. Zong, W. O. Soboyejo, H. -J. Lee, A. G. Ramirez and K. Rajan: J. Materials and Manufacturing Processes 22 175-179 (2007).
  • Combinatorial Methods and Informatics Provide Insight into Physical Properties and Structure Relationships during IPN Formation J. Nowers, S.R.Broderick, K.Rajan and B. Narasimhan: Macromolecular Rapid Communications 28 972-976 (2007).
  • Tracking Correlations between Mechanical Response and Microstructure in Three- Dimensional Reconstructions of a Commercial Stainless Steel: A. C. Lewis, C. Suh, M. Stukowski, A. B. Geltmacher, K. Rajan, G. Spanos – Scripta Materialia– 58 575-578 (2008).
  • Materials Informatics Part I: A diversity of issues: JOM 50 (March 2008).
  • Learning from Systems Biology: An “omics” approach to materials design Journal of Metals JOM 53-55 (March 2008).
  • Informatics for Combinatorial Materials Science: S. Broderick, C.Suh, J. Nowers, B. Vogel, S. Mallapragada, B. Narasimhan and K. Rajan; Journal of Metals (JOM), 56-59 (March 2008).
  • Analyzing Sparse Data for Nitride Spinels Using Data Mining, Neural Nets and Multi-objective Genetic Algorithms: F. Pettersson, C. Suh, H. Saxen, K. Rajan and N. Chakraborti J. Materials and Manufacturing Processes—24:1, 1-15 (2009).
  • Tracking Nanostructural Evolution in Alloys: Large-scale Analysis of Atom Probe Tomography Data on Blue Gene/L: S. Seal, K. Rajan, S. Aluru, M. Moody, A. Ceguerra and S. Ringer; Proceedings 37th Intl Conf. on Parallel Processing (2008).
  • Data Mining and Informatics for Crystal Chemistry: Establishing measurement techniques for mapping structure-property relationships: - C. Suh and K. Rajan – J. Materials Science and Technology 25 466-471 (2009)
  • Data Mining Density of States Spectra for Crystal Structure Classification: an Inverse Problem Approach- S. Broderick, H. Aourag and K. Rajan- J. Statistical Analysis and Data Mining: 1:353-360 (2009).
  • A new approach to describe elemental-property parameters Pierre VILLARS, Jo DAAMS, Yoshihiro SHIKATA, Krishna RAJAN, Shuichi IWATA; Chem. Met. Alloys 1 (2008) 1-23.
  • "Designing superlattices for ultra hard coatings: Data mining approach" by H. Aourag, F. Saidi, S. Broderick, and K. Rajan special issue Physics and Chemistry of Nanoparticles of the Journal of Computational and Theoretical Nanoscience.
  • Informatics for Chemical Crystallography: C. Suh and K. Rajan Journal of Metals (JOM), 56-59 ( March 2009).
  • Principal component analysis and dimensional analysis as materials informatics tools to reduce dimensionality in materials science and engineering, Krishna Rajan, Changwon Suh, Patricio F. Mendez; Statistical Analysis and Data Mining 1: 6, 361-371 (2009).
  • Materials Informatics: Krishna Rajan, Patricio Mendez; Statistical Analysis and Data Mining;1:5, 286 (2009).
  • Identification and Optimization of AB2 Phases Using Principal Component Analysis, Evolutionary Neural Nets, and Multiobjective Genetic Algorithms Akash Agarwal ; Frank Pettersson; Arunima Singh ; Chang Sun Kong ; Henrik Saxén ; Krishna Rajan ;Shuichi Iwata; Nirupam Chakraborti, Materials and Manufacturing Processes, 24:3 274 - 281 (2009).
  • “Adaptation of Francissela tularenis to the Mammalian Environment is Governed by Cues Which can be Mimicked in vitro” KRO Hazlett, SD Caldon, DG McArthur, KA Cirillo, GS Kriimanjeswara, ML Magguilli, M Malik, A Shah, S Broderick, I Golovliov, D Metzger, K Rajan, T Sellati and DJ Loegering: Infection and Immunity 76 (10) 4479-4488 ( October 2008).
  • Multivariate Analysis for Chemistry-Property Relationships in Molten Salts Suh, C; Gadzuric, S; Gaune-Escard, M; Rajan, K Zeitschrift fur Naturforschung A Journal of Physical Sciences 64 467-476 (2009).
  • Informatics and Integrated Computational Materials Engineering: Part II Rajan K Journal of Metals Volume: 61 Issue: 1 Pages: 47-47 Jan 2009.
  • Informatics for Chemical Crystallography Suh C, Rajan K; Journal of Metals, Volume: 61 Issue: 1 pp. 48-53, Jan 2009.
  • A Materials Database for Exploring Material Properties Hrubiak R, George L, Saxena SK, et al.: Journal of Metals Volume: 61 Issue: 1 pp: 59-62; Jan 2009.
  • The simultaneous effect of polymer chemistry and device geometry on the in vitro activation of murine dendritic cells; L.K Petersen, L.Xue, MJ Wannemuehler, K. Rajan and B. Narasimhan Biomaterials 30 28 5131-5142 (2009).
  • Principal component analysis on properties of binary and ternary hydrides and a comparison of metal versus metal hydride properties; L. George, R. Hrubiak, K. Rajan and S. Saxena Journal of Alloys and Compounds Volume: 478 Issue: 1-2, 731-735 (2009).
  • Visualization of High-Dimensional Combinatorial Catalysis Data; C. Suh, SC Sieg, MJ Heying,J. Oliver, W. Maier and K. Rajan; Journal of Combinatorial Chemistry 11 Issue: 3 385-392 (2009).
  • Data mining and informatics for crystal chemistry: establishing measurement techniques for mapping structure-property relationships C. Suh and K. Rajan Materials Science and Technology 25 466-471 (2009).
  • Analyzing Sparse Data for Nitride Spinels Using Data Mining, Neural Networks, and Multiobjective Genetic Algorithms: F. Pettersson, C. Suh, H. Saxe, K.Rajan, and N. Chakraborti. Materials and Manufacturing Processes 24 (1) 2-9 (2009).
  • Data Mining and Informatics for Quantitative Atom Probe Tomography K Rajan, S Aluru, and B Ganapathysubramanian: Microscopy and Microanalysis, 15:264-265 (2009).
  • Multivariate Analysis for Chemistry-Property Relationships in Molten Salts Suh, C; Gadzuric, S; Gaune-Escard, M; Rajan, K Z. Naturforsch. 64a, 467 – 476 (2009).
  • Tracking Chemical Processing Pathways in Combinatorial Polymer Libraries via Data Mining; Scott R. Broderick Joseph R. Nowers, Balaji Narasimhan, and Krishna Rajan; Journal of Combinatorial Chemistry 12 270-277 (2010).
  • Electronic structure prediction via data-mining the empirical pseudopotential method H. Zenasni, H. Aourag, S. R. Broderick, and K. Rajan Phys. Status Solidi B, 247, No. 1, 115–121 (2010).
  • Combinatorial processing libraries for Bulk BiFeO3- PbTiO3 piezoelectric Ceramics; W. Hu, X. Tan, and K. Rajan - Applied Physics A 99 (2) 427-431 (2010).
  • Identifying Factors Controlling Protein Release from Combinatorial Biomaterial Libraries via Hybrid Data Mining Methods; X.Li, L. Petersen, S.Broderick, B. Narasimhan and K.Rajan ACS Combinatorial Sciences 113 50-58 (2010).
  • BiFeO3–PbZrO3–PbTiO3 ternary system for high Curie temperature piezoceramics: W. Hu, X. Tan and K. Rajan: J. European Ceramic Society 31 (5) pp. 801-807 (May 2011).
  • Atom Probe Tomography – a high throughput screening tool of atomic scale chemistry: K. Rajan; J. Combinatorial Chemistry and High Throughput Screening 14 (3), pp 198-206, (2011).
  • Identifying the “inorganic gene” for High Temperature Piezoelectric Perovskites through Statistical Learning P. Balachandran, S.R. Broderick and K. Rajan; Proceeding Royal Society A 467: 2271-2290 (August 8, 2011) Cited as among top ten papers in Proc. Royal Soc. A for 2011.
  • Classification of Oxide Compounds through Data Mining Density of States Spectra: S.R. Broderick and K. Rajan J. Amer. Ceramic Soc. 94 Issue: 9 Pages: 2974-298 (2011).
  • Data Mining Ti-Al Semi-Empirical Parameters for Developing Reduced Order Models; Scott Broderick and Krishna Physica B: Condensed Matter 406, (11) , pp. 2055-206015 (May 2011).
  • Piezoelectric Ceramics with Compositions at the Morphotropic Phase Boundary in the BiFeO3– PbZrO3–PbTiO3 Ternary System: W. Hu, X. Tan and K. Rajan Journal of American Ceramic Society (published on line 1st July 2011- DOI: 10.1111/j.1551-2916.2011.04715.x).
  • Informatics for Quantitative Analysis of Atom Probe Tomography Images: S.K. Suram and K. Rajan in Advanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution eds. D. Seidman and M. Ruhle; MRS Proceedings Vol. 1231 / 1231- NN03-14DOI:10.1557/PROC-1231-NN03-14.
  • Activation of Innate Immune Responses in a Pathogen-Mimicking Manner by Amphiphilic Polyanhydride Nanoparticle Adjuvants L. K. Petersen, A. E. Ramer-Tait, S. R. Broderick, C. S. Kong, B. D. Ulery, K. Rajan, M. J. Wannemuehler, and B. Narasimhan: Biomaterials ( in press- (2011), doi:10.1016/j.biomaterials.2011.05.063).
  • Eigenvalue Decomposition of Spectral Features in Density of States Curves: S. Broderick and K. Rajan; European Physics Letters 95 Issue: 5 Article Number: 57005 DOI:10.1209/0295 5075/95/57005; Published: SEP 2011.
  • Identification of Biologically Significant Genes from Combinatorial Microarray Data: C.S.Kong, J. Yu, C. Minion and K. Rajan; ACS Combinatorial Sciences 13 562-571 (2011).
  • Materials informatics as a computational infrastructure for materials discovery: P.Balachandran and K. Rajan in Proceedings Scientific Discovery through Advanced Computing Program July 10-14, 2011, http://press.mcs.anl.gov/scidac2011/
  • Rational Design of Pathogen-Mimicking Amphiphilic Materials as Nanoadjuvants: Bret D. Ulery, L. K. Petersen, Y. Phanse, C.S. Kong,S.R. Broderick, D.Kumar, A.E. Ramer-Tait, B. Carrillo-Conde, K. Rajan, M. J. Wannemuehler, B.H. Bellaire, D.W. Metzger and B. Narasimhan: Nature Scientific Reports 1, Article number: 198 doi: 10. 1038/srep00198 Published 16 December, 2011.
  • Toward Atomic-Scale Tomography: The ATOM Project. T Kelly, M Miller, K Rajan, S Ringer, A Borisevich, N Dellby and O Krivanek Microscopy and Microanalysis, 17 (Suppl. 2) , pp708-709. doi: 10.1017/S1431927611004417. (2011).
  • Analysis of Ion Evaporation Events through Data Mining: an Experimental Foundation for Interpreting Chemical Imaging in the Atomscope S Broderick, K Kaluskar, M Miller, S. Ringer, T Kelly and K Rajan (2011).Microscopy and Microanalysis, 17 (Suppl. 2), pp 744-745. doi:10.1017/S1431927611004594.
  • Application of Principal Component Analysis to a Full Profile Correlative Analysis of FTIR Spectra: S. Broderick, C. Suh, J. Provine, C.S.Roper, R. Maboudian, R. Howe and K. Rajan Surface and Interface Analysis 44, 365-371 (2012)
  • Crystal growth of ZrW2O8 and its optical and mechanical characterization; Md. Imteyaz Ahmada, Gaurav Mohanty, Lee R. Cambrea, Daniel C. Harris, Krishna Rajan, Mufit Akinc ; Journal of Crystal Growth 343 115-121 (2012).
  • Structure maps for AI4AII6(BO4)6X2 apatite compounds via data mining: P.V. Balachandran and K. Rajan; Acta Crystallographica B – Acta Cryst. B68, 24-33 (2012) Selected by Acta Cryst. B Editor as key paper published in Acta Cryst. B–Int. Union of Crystallography (IUCr) 2012 Newsletter
  • The Future of Atom Probe Tomography: M.K. Miller, T.F. Kelly, K. Rajan and S.P. Ringer; Materials Today 15 158-165 (2012).
  • Rational Design of Binary Halide Scintillators via Data Mining: C.S.Kong and K. Rajan; Nuclear Inst. and Methods in Physics Research, A 680 145-154 (2012).
  • Visions for Atomic Scale Tomography: M. Miller,T.Kelly, K. Rajan and S.P.Ringer: Microscopy Today 12 12-16 (2012).
  • Refining Spatial Distribution Maps for Atom Probe Tomography via Data Dimensionality Reduction Methods". S.K.Suram and K.Rajan; Journal of Microscopy and Microanalysis 18, 941-952 (2012).
  • Data-driven Model for Estimation of Friction Coefficient via Informatics Methods : E.W. Bucholz, C. S. Kong, K. R. Marchman, W. G. Sawyer, S. R. Phillpot, S.B. Sinnott, K. Rajan; Tribology Letters 47 (2) 211-221 (2012).
  • Mapping the 'materials gene' for binary intermetallic compounds—a visualization schema for crystallographic databases: Chang Sun Kong, Pierre Villars, Shuichi Iwata and Krishna Rajan, Journal of Computational Science and Discovery 5, 015004 (2012).
  • Information Theoretic Approach for the Discovery of Design Rules for Crystal Chemistry ACS, Journal of Chemical Information and Modeling : Chang Sun Kong, Wei Luo, Sergiu Arapan, Pierre Villars, Shuichi Iwata, Rajeev Ahuja and Krishna Rajan 52 1812-1820 (2012).
  • Informatics based Uncertainty Quantification in the Design of Inorganic Scintillators: S. Ganguly, C.S.Kong, S.R. Broderick and K. Rajan – Materials and Manufacturing Processes. (DOI:10.1080/10426914.2012.736660 -2013).
  • "A Graph-Theoretic Approach for Characterization of Precipitates in Alloys from Atom Probe Tomography data: S. Samudrala, O. Wodo, S. K. Suram, S. Broderick, K. Rajan, B. Ganapathysubramanian, "Computational Material Science, vol. (in press-2013).
  • “Property Phase Diagrams” for Compound Semiconductors via Data Mining”: S. Srinivasan and K. Rajan ; Materials – on-line journal www.mdpi.com/journal/materials - Special Issue on Compound Semiconductor Materials –Guest eds. J. Narayan and C.L.Reynolds Jr. doi:10.3390/ma6010279 6(1), 279-290 (2013).
  • Mapping Energetics of Atom Probe Evaporation Events through First Principles Calculations: J. Peralta, S. Broderick and K. Rajan; Ultramicroscopy 132 143-151 (2013).
  • Interactive Visualization of Atom Probe Tomography Data at Full Fidelity: A. Bryden, S. Broderick, S.K. Suram, K. Kaluskar, R. LeSar and K. Rajan; Ultramicroscopy –132; 129-135 (2013).
  • Calibration of Reconstruction Parameters in Atom Probe Tomography using a Single Crystallographic Orientation: S.K. Suram and K. Rajan; Ultramicroscopy 132; 136 142 (2013)
  • Data Mining for Isotope Discrimination in Atom Probe Tomography: S.R. Broderick, A. Bryden, S.K. Suram and K. Rajan: Ultramicroscopy 132, 121-128 (2013).
  • Soft Elastomeric Capacitor Network for Strain Assessment over Large Surfaces: S. Laflamme, H.S. Saleem, B. K. Vasan, R. L. Geiger, D. Chen, M.R. Kessler and K. Rajan; IEEE/ASME Trans. on Mechatronics 18(6), 1647-1654. (2013) (
  • Informatics-Aided Band Gap Engineering for Solar Materials: P. Dey, J. Bible, S. Datta, S. Broderick, J. Jasinkski, M.K. Sunkara, M. Menon and K. Rajan; Computational Materials Science ( 83 185-195 (2014)
  • Atom Probe Tomography of Organic/Inorganic Interfaces in Biominerals. Microscopy and Microanalysis L. Gordon, D. Joester, S. Suram, K. Kaluskar and K. Rajan (2012), 18 (Suppl. 2), pp 1608-1609. doi:10.1017/S1431927612009890.
  • Electrical Field Induced Charges in Surface Bonding: Integrating Firs Principles and Atom Probe Tomography: C. Loyola, J. Peralta, S. Broderick and K. Rajan: Microscopy and Microanalysis 19 / Supplement S2 pp 1004 – 1005 (2013)
  • Application of Computational Homology and Graph-Theoretic Approaches for Quantitative Chemical Imaging in Atom Probe Tomography: S. Broderick, J. Peralta, S, K. Kaluskar, B. Ganapathysubramanian and K.Rajan Microscopy and Microanalysis ;19 / Supplement S2 ; pp 930 – 931 (2013)
  • A systems approach to designing next generation vaccines: combining alpha-galactose modified antigens with nanoparticle platforms ; Y.Phanxe, BR Carrilo-Conde, AE Ramer-Tait, SR Broderick, CS Kong, K. Rajan, R Flick, RB Mandell, B Narasimhan, MJ Wannemuehler ; Scientific Reports, 4 3775 (2014 )
  • Nanoinformatics workshop report: current resources, community needs,and the proposal of a collaborative framework for data sharing and information integration: S. L. Harper J.E.Hutchinson, N.Baker, M. Ostraat, S. Tinkle, J.Steevens, M.D. Hoover, J.Adamick, K.Rajan, S.Gaheen, Y.Cohen, A. Nel, R.E. Cachau and M.Tuominen ; J. Computational Science and Discovery 6 1-3 (2013)
  • Informatics guided discovery of surface structure-chemistry relationships in catalytic nanoparticles ; AN Andriotis, G Mpoumpakis, S.Broderick, K Rajan, S Datta,M Sunkara, M. Menon ; J. Chemical Physics 140 ,094705 (2014)
  • An Integrated High Temperature Environmental Cell for Atom Probe Tomography Studies of Gas-Surface Reactions: instrumentation and results: S.Rumpala, S. Broderick, P. Bagot and K.Rajan-Ultramicroscopy 141, 16-21 (2014)
  • First Principles Modeling Studies of Field Evaporation: Preliminary Studies Relevant to the Atomscope. J Peralta, M Miller, S Ringer, T Kelly, S Ringer and K Rajan Microscopy and Microanalysis, 17 (Suppl. 2), pp 712-713 (2011);
  • Electronically driven structural transitions in A10 (PO4)6F2 apatites (A=Ca, Sr, Pb, Cd, and Hg): P. Balachandran, K. Rajan and J.M. Rondinelli; Acta Crystallograhica B70 Special Issue: SI Pages: 612-615 Part: 3 (2014)
  • Statistically based assessment of formation enthalpy for intermetallic compounds; RF Zhang and K. Rajan; Chemical Physics Letters 612 177-181 (2014)
  • Bond deformation paths and electronic instabilities of ultraincompressible transition meta-diborides: Case study of OsB2 and IrB2 By: Zhang, R. F.; Legut, D.; Wen, X. D.; et al Physical Review B, 90, 094115 (2014)
  • New Visible Light Absorbing Materials for Solar Fuels, Ga(Sb-x)N1-x B S Sunkara VK Vendra,; JB Jasinski, J Bogdan , T Deutsch, AN Andriotis, K Rajan, M Menon and M. Sunkara ; Advanced Materials 26 18 2878-2882 (2014)
  • An informatics based analysis of the impact of isotope substitution on phonon modes in Graphene; S. Broderick, U. Ray, S. Srinivasan, K. Rajan and G. Balasubramanian; Applied Physics Letters; 104 243110 (2014) .
  • Crystal growth and mechanical characterization of ZrMo2O8 IM Ahmad, G. Mohanty, K.Rajan, M. Akinc. J. Crystal Growth 404, 100-106 (2014)
  • Static Characterization of a Soft Elastomeric Capacitor for Non Destructive Evaluation Applications H. Saleem,; S. Laflamme, H. Zhang,. Edited DE: Chimenti, LJ Bond, DO Thompson, in 40TH Annual Review of Progress in Quantitative Nondestructive Evaluation: 33A & 33B Book Series: AIP Conference Proceedings 1581 Pages: 1729 1736 (2014)
  • A Software Framework for Data Dimensionality Reduction: application to chemical crystallography: S.K. Samudrala, P.V. Balachandran, J. Zola, K. Rajan and B. Ganapathysubramanian: Integrating Materials and Manufacturing Innovation 3, 17 (2014) doi: 10.1186/s40192-014-0017-5
  • Large area strain analysis using scanning transmission electron microscopy across multiple images AA Oni, X. San, SV Raju, S Dumpala, S Broderick , A Kumar, S Sinnott, S Saxena, K Rajan and J M LeBeau; Appl. Phys. Lett. 106 011601 (2015) ,
  • Mining for elastic constants of intermetallics from the charge density landscape C.S. Kong, S.R. Broderick, T.E. Jones, C. Loyola, M.Eberhart and K. Rajan; Physica B 458 1-7 (2015)
  • Effect of B and Cr on elastic strength and crystal structure of Ni3Al alloys under high Pressure, S Raju, A Voni, BKGodwal, J. Yan, V. Drozd, S. Srinivasan ; JM LeBeau, K. Rajan S.K. Saxena, J. Alloys and Compounds 619 : 616 -620 (2015)
  • "Integrated atomistic chemical imaging and reactive force field molecular dynamic simulations on silicon oxidation S. Dumpala, S. R. Broderick, U. Khalilov, E.C. Neyts, A. C. T. van Duin, J Provine, R.T. Howe and K. Rajan; Applied Physics Letters 106 0111602 (2015)
  • Ion-irradiation Induced Clustering In W-Re And W-Re-Os Alloys: A Comparative Study Using Atom Probe Tomography And Nanoindentation Measurements ; A. Xu, C. Beck; D. E.J. Armstrong; K. Rajan; P.A.J. Bagot and S. G. Roberts; Acta Materialia 87 121-127 (2015)
  • Automated Voxelization of 3D Atom Probe Data through Kernel Density Estimation; Srikant Srinivasan, Kaustubh Kaluskar, Santoshrupa Dumpala, Scott Broderick, Krishna Rajan, Ultramicroscopy, In Press, Corrected Proof, Available online 18 March 2015
  • Extracting Features buried within High Density Atom Probe Point Cloud Data through Simplicial Homology Srikant Srinivasan, Kaustubh Kaluskar, Scott Broderick, Krishna Rajan, Ultramicroscopy, In Press, Corrected Proof, Available online 26 April 2015
  • Mining information from atom probe data: J.M.Cairney, K.Rajan, D.Haley, B.Gault, P.Bagot, P-P Choi, P.J.Felfer, S.P.Ringer, R.K.W.Marceau and M.P. Moody; Ultramicroscopy 159(2) 324-337 (2015)
  • Combination Nanovaccine Demonstrates Synergistic Enhancement in Efficacy Against Influenza.: K. Ross, J. Adams, H. Loyd, S. Ahmed, A. Sambol, S. Broderick, K. Rajan, M. Kohut, T. Bronich, M. Wannemuehler, S. Carpenter, S. Mallapragada, B. Narasimhan .” ACS Biomaterials Science & Engineering. 2, 368-374 (2016)
  • Atom Site Preference and γ/ γ’ Mismatch Strain in Ni-Al-Co-Ti Superalloys; A.A. Oni, S.R. Broderick, K. Rajan, J.M. LeBeau; .” Intermetallics. 73, 72-78 (2016)
  • Extracting Chemistry-Property Relationships by Mining Atom Probe Evaporation Events. S. Broderick, K. Rajan; Microscopy and Microanalysis, 22 S3, 700-701 (2016)
  • Impact of Extreme Electrical Fields on Charge Density Distributions in Alloys.” C. Loyola, J. Peralta, S.R. Broderick, K. Rajan; Microscopy and Microanalysis, 22 S3, 660-661 (2016)
  • Impact of Extreme Electrical Fields on Charge Density Distributions in Al3Sc Alloy.” C. Loyola, J. Peralta, S.R. Broderick, K. Rajan Journal of Vacuum Science and Technology A 34,061404 (2016) 291. Computational Discovery of Stable M2AX Phases.” M. Ashton, R.G. Hennig, S.R. Broderick, K. Rajan, S. Sinnott; Physical Review B. 94,054116 (2016) 292. A Fast Hybrid Methodology based on Heuristics and Quantum Methods for Evaluating Materials Properties : C.S. Kong, M. Haverty, H. Simka, S. Shankar and K. Rajan; Modeling and Simulation in Materials Science and Engineering – in press (2017) 293. Functionalization Promotes Pathogen-Mimicking Characteristics of Polyanhydride Nanoparticle, Yashdeep Phanse, Brenda R. Carrillo-Conde, Amanda E. Ramer-Tait, Rajarshi Roychoudhury, Scott Broderick, Nicola Pohl, Krishna Rajan, Balaji Narasimhan, Michael J. Wannemuehler, and Bryan H. Bellaire: Journal of Biomedical Materials Research Part A DOI:10.1002/jbm.a.36128 (2017)