Chu-Ryang Wie

Professor

Specialty/Research Focus: Semiconductor devices - device reliability under voltage/current stress, radiation (gamma-ray, proton, x-ray) effect, X-ray analysis of semiconductor materials such as metamorphic buffer materials using reciprocal space mapping and other x-ray methods, Semiconductor nanodevice visual simulation, quantum entanglement and visualization.

Contact Information

230 B Davis Hall

Buffalo, NY 14260

Phone: (716) 645-1023

Email: wie@buffalo.edu

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