Chu-Ryang Wie

PhD

Chu Ryang Wie.

Chu-Ryang Wie

PhD

Chu-Ryang Wie

PhD

Specialty/Research Focus

Semiconductor devices - device reliability under voltage/current stress; radiation (gamma-ray, proton, x-ray) effect; X-ray analysis of semiconductor materials such as metamorphic buffer materials using reciprocal space mapping and other x-ray methods; semiconductor nanodevice visual simulation; quantum entanglement and visualization

Contact Information

230 B Davis Hall

Buffalo NY, 14260

Phone: (716) 645-1023

wie@buffalo.edu

Biography Teaching Research

Education

  • PhD, Applied Physics, California Institute of Technology